Paper

{
  "raw_xml": "<entry>\n    <id>http://arxiv.org/abs/2603.01867v1</id>\n    <title>Absolute scintillator light yield correction for SiPIN readout via Transfer Matrix Method and Geant4 optical simulation</title>\n    <updated>2026-03-02T13:48:29Z</updated>\n    <link href='https://arxiv.org/abs/2603.01867v1' rel='alternate' type='text/html'/>\n    <link href='https://arxiv.org/pdf/2603.01867v1' rel='related' title='pdf' type='application/pdf'/>\n    <summary>Precise measurement of the absolute light yield (LY) of scintillators has long been limited by systematic effects inherent in realistic readout geometries. Large-angle incidence, multiple reflections inside the optical housing, and refractive-index mismatch at the coupling interface all introduce biases that cannot be removed by a simple conversion based on the detector's nominal quantum efficiency. To address this problem, we present a correction method that combines the Transfer Matrix Method (TMM) with Geant4 optical Monte Carlo simulation. A wave-optics model of the SiPIN surface thin-film stack is used to extract the angle- and wavelength-dependent single-hit detection probability $p_{\\mathrm{det}}(λ,θ)$, which is then dynamically coupled into the macroscopic photon transport simulation, achieving a full-chain integration of the microscopic interface optical response with macroscopic geometric light collection. We demonstrate the method using a GAGG:Ce crystal as the test sample. Two types of optical housings -- a high-absorption Absorber and a high-reflection Reflector -- are each combined with air and optical-grease coupling, forming four independent configurations whose overall photon-to-signal conversion efficiencies $α_{\\mathrm{SiPIN}}$ span more than a factor of three. Despite the very different optical boundaries, the intrinsic light yields derived from the four configurations show excellent mutual consistency (coefficient of variation $= 1.8\\%$). The measured intrinsic light yield of GAGG:Ce is $LY_{\\mathrm{int}} = (5.63 \\pm 0.10_{\\mathrm{spread}} \\pm 0.16_{\\mathrm{syst}}) \\times 10^{4}~\\mathrm{ph/MeV}$. The correction framework effectively decouples the systematic influence of complex geometry and interface optics from photon detection, providing a general-purpose scheme for high-precision, traceable scintillator characterization.</summary>\n    <category scheme='http://arxiv.org/schemas/atom' term='hep-ex'/>\n    <category scheme='http://arxiv.org/schemas/atom' term='physics.optics'/>\n    <published>2026-03-02T13:48:29Z</published>\n    <arxiv:comment>26 pages, 13 figures</arxiv:comment>\n    <arxiv:primary_category term='hep-ex'/>\n    <author>\n      <name>Ge Ma</name>\n      <arxiv:affiliation>Department of Engineering Physics, Tsinghua University, Beijing 100084, China</arxiv:affiliation>\n    </author>\n    <author>\n      <name>Zhiyang Yuan</name>\n      <arxiv:affiliation>School of Physics, State Key Laboratory of Nuclear Physics and Technology, Peking University, Beijing 100871, China</arxiv:affiliation>\n    </author>\n    <author>\n      <name>Chencheng Feng</name>\n      <arxiv:affiliation>School of Physics, State Key Laboratory of Nuclear Physics and Technology, Peking University, Beijing 100871, China</arxiv:affiliation>\n    </author>\n    <author>\n      <name>Zirui Yang</name>\n      <arxiv:affiliation>Department of Engineering Physics, Tsinghua University, Beijing 100084, China</arxiv:affiliation>\n    </author>\n    <author>\n      <name>Zhenwei Yang</name>\n      <arxiv:affiliation>School of Physics, State Key Laboratory of Nuclear Physics and Technology, Peking University, Beijing 100871, China</arxiv:affiliation>\n    </author>\n    <author>\n      <name>Ming Zeng</name>\n      <arxiv:affiliation>Department of Engineering Physics, Tsinghua University, Beijing 100084, China</arxiv:affiliation>\n    </author>\n  </entry>"
}